Quantification of artifacts in scanning electron microscopy tomography: Improving the reliability of calculated transport parameters in energy applications such as fuel cell and battery electrodes

14.11.2014

Klingele M, Zengerle R, Thiele S

Journal of Power Sources 275 (2015) 852-859

Focused ion beam and scanning electron microscopy tomography (FIB-SEMt) is commonly used to extract reactant transport relevant parameters from nano-porous materials in energy applications, such as fuel cells or batteries. Here we present an approach to virtually model the errors in FIB-SEMt which are caused by the FIB cutting distance. We further present a method to reduce FIB cutting distance errors in all investigated parameters.

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Quantification of artifacts in scanning electron microscopy tomography: Improving the reliability of calculated transport parameters in energy applications such as fuel cell and battery electrodes